Crystallization study of (As₂S₃)₁₀₀-x(SbSI)x amorphous films by the optical method

摘要

The results of isothermal and nonisothermal crystallization investigations of\ud the (As₂S₃)₁₀₀-x(SbSI)x (53≤x≤80) thin films are given. It is shown that the films\ud crystallization is accompanied by a sharp decrease in transmission. The phase structure\ud arising in the matrix of films during crystallization corresponds to the structure of\ud crystalline SbSI. The formation mechanism of nanocrystalline SbSI inclusions in the\ud amorphous matrix is discussed.